01 November 2011
The White Paper explains the science behind the sophisticated strain gauge technologies of sputtered thin film and chemical vapour disposition used in these robust but yet extremely accurate instruments. The paper also discusses how advanced ASICs (application specific integrated circuits) are being used to provide enhanced performance and functionality.
This useful and informative guide provides the background knowledge needed to help benefit OEMs and end users optimise and protect industrial equipment in a wide range of industries and environments. To view this document go to: http://www.gemssensors.com/en/About-Gems-Sensors/~/media/WhitePapers/GEMS%20-%20MachineBuildingnet%20Whitepaper.pdf
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