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White papers

Developing more robust, flexible electronic devices

This whitepaper looks at the use of confocal laser scanning microscopy with Olympus’ LEXT imaging platform, as an alternative to atomic force microscopy (AFM) to facilitate the development of robust flexible electronic devices.

The LEXT provides information, previously only generated with AFM, showing the link between strain and crack evolution.

Company: Olympus Optical, Category: White Papers

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