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IEC announces Lord Kelvin Award winners

19 October 2010

During the recent IEC (International Electrotechnical Commission) General Meeting that took place in Seattle, three individuals were honoured with the Lord Kelvin Award for lifelong contribution to electrotechnology. The awards were presented by the IEC President, Jacques Régis.

The award is the IECs highest tribute and is only granted to a maximum of three outstanding individuals in any one year. The Award was first created in 1995 and named after the IECs first president, William Thompson, 1st Baron of Kelvin. Kelvin was an incessant inventor and through his mathematical genius, significantly contributed to the advancement of modern physics and science, and the understanding and practical application of electrotechnology.

IEC experts who receive the Lord Kelvin Award, have the same drive to understand and improve the practical applications of the millions of electrical and electronic devices that are part of our lives.

This year the award was given to:
Jerome E. Dennis from the US. Dennis is an expert in the area of radiation safety and laser safety and is active in the development of regulatory policies for radiation safety. He is also an author and co-author of numerous papers. He recently retired after 33 years in the US FDA’s (Food and Drug Administration) CDRH (Center for Devices and Radiological Health.

Bernard Dumortier from France. Dumortier has made contributions to the IEC in the field of industrial automation. He was instrumental in achieving agreement on internationally relevant rules and specifications for Fieldbus, the digital protocol for process automation.

Gösta Fredriksson from Sweden. As chairman of the IECEE (IEC System of Conformity Testing and Certification for Electrotechnical Equipment and Components), Fredriksson has been instrumental in expanding the influence and importance of IECEE, the flagship IEC Conformity Assessment System. The system enables companies to have a product tested in one country and all members will accept the resulting test certificate and report without duplicating any of the completed tests. This saves industry money and to significantly reduce time to market.


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